JPH0416943B2 - - Google Patents

Info

Publication number
JPH0416943B2
JPH0416943B2 JP56102917A JP10291781A JPH0416943B2 JP H0416943 B2 JPH0416943 B2 JP H0416943B2 JP 56102917 A JP56102917 A JP 56102917A JP 10291781 A JP10291781 A JP 10291781A JP H0416943 B2 JPH0416943 B2 JP H0416943B2
Authority
JP
Japan
Prior art keywords
copper plate
thick copper
printed board
probe card
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56102917A
Other languages
English (en)
Japanese (ja)
Other versions
JPS584943A (ja
Inventor
Mitsuru Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10291781A priority Critical patent/JPS584943A/ja
Publication of JPS584943A publication Critical patent/JPS584943A/ja
Publication of JPH0416943B2 publication Critical patent/JPH0416943B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10291781A 1981-06-30 1981-06-30 低インピ−ダンスプロ−ブカ−ド Granted JPS584943A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10291781A JPS584943A (ja) 1981-06-30 1981-06-30 低インピ−ダンスプロ−ブカ−ド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10291781A JPS584943A (ja) 1981-06-30 1981-06-30 低インピ−ダンスプロ−ブカ−ド

Publications (2)

Publication Number Publication Date
JPS584943A JPS584943A (ja) 1983-01-12
JPH0416943B2 true JPH0416943B2 (en]) 1992-03-25

Family

ID=14340203

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10291781A Granted JPS584943A (ja) 1981-06-30 1981-06-30 低インピ−ダンスプロ−ブカ−ド

Country Status (1)

Country Link
JP (1) JPS584943A (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE20114544U1 (de) * 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5216177A (en) * 1975-07-30 1977-02-07 Hitachi Ltd Probe card
JPS59762U (ja) * 1982-06-22 1984-01-06 佐藤製罐株式会社 密閉容器

Also Published As

Publication number Publication date
JPS584943A (ja) 1983-01-12

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